Topic:HALT and HASS: A New Paradigm for Rapid Reliability Development
Abstract:This brief overview will discuss the basic methods of Highly Accelerated Life Testing (HALT) which are run during the design phase of a program to find design weaknesses and eliminate them, and how Highly Accelerated Stress Screens (HASS) are developed from HALT. Even though the methods of HALT and HASS have existed for over 20 years, they are one of the most misunderstood methodologies in engineering. HALT and HASS are a fundamental paradigm shift in the development of reliable electronics hardware in that they are not used to determine a “life” prediction. HALT is a method to discover reliability weak links using the inherent strength limits found empirically in step stress testing. HASS is a production screening method to detect latent manufacturing defects based on the strengths found in HALT. A case history will show how one company achieved a 90% reduction in warranty returns after using HALT and HASS. This overview will also show how using HALT can help to accelerate the detection of software and firmware reliability issues. slides
Speaker:Kirk Gray, Accelerated Reliability Solutions
Speaker’s Bio:Kirk Gray began working with Dr. Gregg Hobbs, the creator of HALT and HASS, at StorageTek Corporation in 1989, and has 20 years experience writing about, teaching, and using HALT. He has over 32 years in the electronics manufacturing industry beginning in the 1980’s installing and servicing high vacuum semiconductor process equipment. From 2003 to 2010, he was a Senior Reliability Engineer at Dell, where he created and implemented the HALT to HASS development process on power supplies for client and server hardware that became a standard process for all Dell suppliers. The process was recognized for being the highest ROI (Return on Investment) ongoing reliability testing for the company. Kirk is a Senior Member of the IEEE and Charter Committee Member of the IEEE/CPMT Workshop on Accelerated Stress Testing and Reliability. He is a Senior Collaborator with the University of Maryland’s Center for Advanced Life Cycle Engineering (CALCE) Consortium. He has presented papers on accelerated testing at numerous conferences and authored articles for leading industry magazines. He holds a BSEE from the University of Texas.
Date & Time:Wednesday, May 22, 2013 : networking at 6:00 p.m., business and program from 6:30 to 8:30 p.m.
Location:PoK-e-Jo’s, 2121 W. Parmer Lane at Lamplight Village, Austin, TX 78727
Map:map
Cost:$5.00 minimum charge for the restaurant. Supper is at optional extra cost.
Reservations:Not required. All interested parties are invited to attend.
RSVP and for more information:Please email to ctcnaustin at gmail dot com.