AUTOMATED TESTING USING ARTIFICIAL INTELLIGENCE (AI) AND MACHINE LEARNING (ML)

June 2026 meeting is virtual only

AUTOMATED TESTING USING ARTIFICIAL INTELLIGENCE (AI) AND MACHINE LEARNING (ML)

Himanshu Pathak 
himanshu.pathak086@gmail.com

Mr. Pathak is a seasoned technology leader with over 15 years of IT experience. He currently serves as the QA Automation Engineering Lead at Meta (formerly Facebook), where he is at the forefront of integrating artificial intelligence into quality assurance and testing.

He spearheads the use of generative AI to transform manual testing and automation processes, significantly improving efficiency and effectiveness. In this capacity, he ensures the quality of Meta’s AI-driven solutions, applying rigorous QA standards to cutting-edge projects and driving innovation in the field of software testing.

Over his extensive career, Himanshu has contributed his expertise to global tech leaders like Microsoft and Intel, broadening his experience across diverse projects. His innovative approach has earned him multiple hackathon awards at Meta, highlighting his creative problem-solving skills and commitment to excellence.

He holds a Master of Business Administration from Louisiana State University, Shreveport, USA and a Bachelor of Technology from UPTU, a combination that equips him with both business acumen and engineering expertise.

URL TBD

URL TBD

Automated testing is undergoing a transformative shift with the advent of Artificial Intelligence and Machine Learning, addressing key challenges such as script maintenance, test data generation, writing automated test cases, tests prioritization, and false positives. The presentation outlines solutions using AI, highlights efficiency, accuracy, coverage, and ROI metrics, and emphasizes challenges including data quality, security, privacy, regulatory challenges, and the need for contextual understanding and transparency in making decisions. It also points to the future with explainable AI and executing tests from plain language.

https://events.vtools.ieee.org/m/562284