EMI/EMC contribute to around 30% of failures in the verification stage costing the electronics industry billions in lost revenue. Today, EMI/EMC compliance is achieved by preparing a prototype and performing measurements in a standard laboratory. This results in iterative re-prototyping which causes delays in time-to-market and sometimes leads to cancelled projects and lost opportunities. This presentation will discuss a model-based system-level simulation approach for front-loading EMI/EMC. New research into the generation of IC-models using physics and data-based approaches will be discussed. This approach can ensure first-time compliance pass and reduce system-level functional failures.
Virtual: https://events.vtools.ieee.org/m/564773