September 2024

IEEE CTS LMAG AND CTCN
The September meeting is a hybrid meeting, physical and virtual, starting at 6 PM CST at the Asian American Resource Center.
TopicSystem and Platform Debug using the Ubiquitous USB Type-C Connector
AbstractSystem and platform debug is extremely important to launch products early-on, to avoid undue delays in production, for faster customer enablement, in-field debug, etc. Traditional debug techniques using open chassis is useful for system debug, but it takes unsurmountable amount of time for removing the chips from the platform leading to excessive debug throughput for platform debug. With the availability of USB Type-C connectors on most computer platforms, enabling debug using USB Type-C connectors opens up an entirely new way of platform debug without opening up the platform called closed-chassis debug.

Closed-Chassis Platform Debug using the available functional receptacle, such as USB Type-C, on a final-form factor device is of paramount importance for Hardware, Software and Firmware debug. With Type-C receptacle becoming widely the most popular choice by most OEMs/ODMs, this ubiquitous connector/receptacle becomes the choicest interface for debug purposes. This presentation starts with the traditional debug techniques, with details on the history of USB and how USB evolved to the Type-C connector and then going on to cover the system and platform debug techniques as well as open and closed-chassis debug using the ubiquitous USB Type-C connector.
SpeakerDr. Sankaran Menon
Sankaran Menon
Email: smenon@ieee.org
Speaker’s bioDr. Sankaran Menon has been working in the semiconductor area for over three and half decades. After completing his advanced degrees from Colorado State University in Fort Collins, CO, he served as Assistant Professor in the Dept. of Electrical and Computer Engineering at the South Dakota School of Mines Technology in Rapid City, South Dakota. After working and publishing in the area of VLSI Testing, he made a switch to the industry by joining Texas Instruments in Dallas, Texas where he worked on DFT on ASICs. He then joined Intel in Austin and worked for over 25+ years as DFT Architect on Xscale SoCs as well as Atom/Big-Core SOCs and FPGA/Structured ASICs.

Sankaran Menon is a Senior Member of IEEE and is chair of many IEEE conferences/ workshops and has been granted over 34+ patents and has filed over 80+ patent filings. He has published over 100+ publications and has been a significant contributor to several Standards/Workgroups, such as IEEE 1500, IEEE 1149.1, IEEE 1149.7, MIPI Debug standards, USB Debug Class, USB Type-C Debug standards. He is Chair of IEEE P2929 Standard for System-Level State Extraction for Functional Validation and Debug. He has co-founded over 10 IEEE conferences/workshops in the area of VLSI Testing/Debug.

Sankaran Menon holds Ph.D. and MSEE degrees from Colorado State University, Fort Collins, USA.
Date & Time19 Sept 2024, 18:00 – 19:30 Central Time
LocationAsian American Resource Center
8401 Cameron Road, Austin, TX 78754
Room Number: 8
VirtualZoom ID: 604 353 3501
Passcode will be provided to registrants later
Presentation System and Platform Debug using the Ubiquitous*USB Type-C Connector

Reservation
Registrationhttps://events.vtools.ieee.org/m/431672