System and platform debug is extremely important to launch products quickly, to avoid undue delays in production, for faster customer product introduction, for in-field debug, etc. Traditional debug techniques using open-chassis are useful for system debug, but removing the chips from the platform takes an unacceptable amount of time in today's competitive environment. The availability of USB Type-C connectors on most computer platforms opens up an entirely new platform debug method called closed-chassis debug. This new type of debug eliminates the need to open up the platform.
Closed-Chassis Platform Debug using an available functional receptacle, such as USB Type-C, on a final form factor device is now highly important for Hardware, Software and Firmware debug. The wide acceptance of the Type-C receptacle by most OEMs/ODMs, makes this connector/receptacle the optimum interface for debug purposes. This presentation starts by introducing traditional debug techniques, then gives details on the history of USB and how USB evolved to the Type-C connector. It then goes covers new system and platform debug techniques including open and closed-chassis debug using the ubiquitous USB Type-C connector.
Speaker(s): Sankaran Menon,
Agenda:
6:00 to 6:05 PM – Open for participants to enter and network.
6:05 to 6:10 PM – IEEE LM and CTCN Business meeting and to introduce speaker.
6:10 to 7:30 PM – Formal Program and Q&A.
Room: 8, Bldg: Asian American Resource Center, 8401 Cameron Rd., Austin, Texas, United States, 78754, Virtual: https://events.vtools.ieee.org/m/431672