The science and engineering of materials and device structures at the nanometer scale have become central themes in fields ranging from solid-state electronics and photonics to the biological sciences. As a result, the characterization, understanding, and control of material and device properties at the nanometer to atomic scale have emerged as essential aspects of materials and device engineering. We will discuss some recent results from our laboratory in which metal, dielectric, and semiconductor nanostructures are exploited to achieve increased efficiency in solar energy harvesting, and to enable near-field Raman spectroscopy for solid-state nanostructure characterization. In the area of solar energy harvesting, we discuss approaches for improving power conversion efficiency in thin-film solar cells using light scattering by metal and dielectric nanostructures integrated with semiconductor absorbing layers, and for employing nanostructured catalysts combined with epitaxial complex oxides grown on silicon substrates for improved efficiency in solar-driven water reduction. In the area of nanoscale optical characterization, we will show how plasmonic localization of light in tip-enhanced Raman spectroscopy enables highly localized characterization of bonding, strain, and phonon-carrier interactions at the nanoscale in Ge/SiGe core/shell semiconductor nanowires. Time permitting, recent results on demonstration and analysis of highly controlled, room-temperature quantized conductance in single-crystal TiO2 resistive switching elements grown on silicon will also be discussed.

Speaker(s): Dr. Edward Yu,

Location:
Room: 1064
Bldg: Rice University – Duncan Hall
6100 Main St
Houston, Texas
77030