Attendance is FREE. To access the event please register. Note: Registration information will be shared with sponsors. By registering for this event you consent to receive email communications from the sponsor and IEEE Spectrum relating to this topic. Duration: 1 hour   Available On Demand Digitalization changes everything, everywhere! It’s inevitable, new business drivers are forcing the Electronics industry to rethink every element of their business. Virtually every company is talking about innovation and digitalization. The challenge is turning the talk into tangible results. Join us to learn more about how digitalization is disrupting and changing the way we do business today, how you can quickly take advantage of this disruption. As well as learning about some of the key best practices and guidelines to consider when adopting this strategy: How to take advantage of the speed, flexibility, efficiency and increased quality by adopting a digitalization strategy Realizing the benefits of the Digital Twin, critical validation before production with virtual process modeling and simulation Understanding the factors driving businesses towards more control of their global operations and supply chain, including the extended ecosystem of designers, builders, factories, suppliers, and customers Achieving sustainability and adopting best practices in order to meet regulatory compliance and the demands of the consumers Using an integrated approach to digitalization is the key to providing the necessary visibility and insight in order to make the most informed and wise decisions. Not just for your company, but for future generations. Whatever you call it Industry 4.0, Smart Manufacturing or Digitalization its coming and the traditional ideas of what a product or company is are changing. Learn how you can meet these challenges head on by working with the right partner for your business.             SPEAKER: David Accomazzo – VP Electronics Industry,  Siemens David holds a Bachelor of Science in Mechanical Engineering from University of California. He has an extensive background in leading business development in the areas of IoT, Digital Enterprise and Industry 4.0. Primarily focusing on the Electronics and Semiconductor Industries in the US. SPEAKER: Mark Lukens – Director, Business and Solutions Consulting, Siemens Mark holds an MSME in Mechanical Engineering from San Diego State University. For more than 10 years Mark has been leading business development and technical support organizations to identify business solutions and value justifications, and develop and demonstrate PLM solutions in leading U.S. electronics and semiconductor companies. Sponsored by:

Date: Wednesday, July 26, 2017 Time: 0:100 PM Central /02:00 PM Eastern Daylight Time Duration: 1 hour Periodically ensuring that Automated Test Equipment (ATE) is functioning properly is a critical part of product manufacturing, and is often required in regulated industries.  Properly verified ATE helps to maintain consistent test results and reduces downtime.  Automated self-test is ideal for periodic verification of test system performance, and can be used to get a system back online faster after system changes or failures.  In this session, Bloomy’s ATE Product Manager will discuss three of the most common methods of self-testing your ATE, including System Self-Test ITA’s (Interchangeable Test Adapters, or fixtures), Loopback Units Under Test (UUTs), and Golden Sample UUTs.   By understanding test coverage, advantages, disadvantages, and best practices for each method you can decide which "test the tester" method is best for your application.   SPEAKER: Grant Gothing, ATE Product Manager, Bloomy, Inc Grant Gothing is Automated Test Equipment (ATE) Manager at Bloomy, Inc. (Windsor, CT). He is responsible for hardware and software design and standardization for the company’s ATE platform, the UTS.  In his 10 years at Bloomy, Grant has developed dozens of automated test systems for a wide variety of industries, and has held positions in project and product engineering, management, sales, and marketing.  Throughout these roles, he has continuously improved and standardized the design and build of Bloomy’s automated test offerings.  Grant holds an M.S. in Mechanical Engineering from Virginia Tech, where he focused on autonomous vehicles.  He is a National Instruments Certified LabVIEW Architect and Certified TestStand Architect. MODERATOR: Douglas McCormick IEEE Spectrum “Tech Talk” contributor Sponsored by: