Name: Tech Insider Webinar: A Fully Automatic Test System for Characterizing Wide-I/O Micro-Bump Probe Cards
Start: 2017-06-21T11:00:00-05:00
End: 2017-06-21T12:00:00-05:00
Location: Webinar

List
Month
Day
Photo
Week

May 1

Featured May 1, 2017 @ 8:00 am - May 4, 2017 @ 5:00 pm CDT

2017 Offshore Technical Conference

May 1

6:00 pm - 8:30 pm

OTC – Mark Bokenfohr

May 12

2:00 pm - 3:00 pm

IEEE AP/ED/MTT Chapter: Bluetooth Low Energy (BLE) Communication System for Medical Applications and Medical Body Area Network (MBAN) Systems

May 25

5:00 pm - 6:30 pm

IEEE HOU Sec: ExCom Meeting

May 25

6:30 pm - 8:15 pm

IEEE HOU Sec.: Mapping Alterations to Brain Cells due to Stroke and Concussions

May 29

12:00 pm - 1:00 pm

Webinar: Power Components for Battery Applications

Free

May 29

Featured 5:30 pm - 7:00 pm

Meeting: HOU Section Consultant Network

May 31

12:00 pm - 1:00 pm

Free Tech Insider Webinar: RF Measurement Challenges for Emerging 5G and Millimeter Wave Devices

Free

Jun 1

5:30 pm - 8:30 pm

Engineering Council of Houston 2017 Awards Banquet

Jun 21

Featured 11:00 am - 12:00 pm

Tech Insider Webinar: A Fully Automatic Test System for Characterizing Wide-I/O Micro-Bump Probe Cards

Free