Neutral-grounding resistors (NGR) for industrial power systems are often selected without consideration of the nature of the loads on the system. Where a significant proportion of system demand is from adjustable-speed drives (ASD), unexpected performance problems, such as the NGR continually running hot without a …
You may think that IEEEXplore is just a research database for discovery and access to journal articles, conference proceedings, technical standards, and related materials on computer science, electrical engineering and electronics, and allied fields, but did you know that you can also leverage it for more than just research?
Wow, users can …
The COVID-19 global health crisis was a unique challenge that impacted many of our members of the IEEE family. Governments around the world issued restrictions on travel, gatherings, and meetings in an effort to limit and slow the spread of the virus.
The health and safety …
Webinar information will be forwarded to all registered attendees.
The Center for Leadership Excellence (CLE) is designed to serve the multiple and diverse range of IEEE user communities. From volunteers, non-volunteers to students, members, and conference organizers, the site offers a simpler and effective learning experience. …
Tech Insider Webinar: The State of PLM in the Cloud: Addressing the Trends, Challenges and Benefits
Not sold on the benefits of PLM in the Cloud? Do you have integration, security, or data lock-in concerns that are stopping you from moving forward? You’re not alone.
Register for …
Date: Wednesday, July 26, 2017
Time: 0:100 PM Central /02:00 PM Eastern Daylight Time
Duration: 1 hour
Periodically ensuring that Automated Test Equipment (ATE) is functioning properly is a critical part of product manufacturing, and is often required in regulated industries. Properly verified ATE helps to maintain consistent test results …
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Duration: 1 hour Available On Demand
Digitalization changes everything, everywhere! …
Overview
Title: Tech Insider Webinar: A Fully Automatic Test System for Characterizing Wide-I/O Micro-Bump Probe Cards
Date: Thursday, July 06, 2017
Time: 12:00 PM Eastern Daylight Time
Duration: 1 hour
In the context of pre-, mid-, and post-bond testing of dies in a 2.5D- and 3D-stacked IC, a fully automatic …
Today, many systems from electric vehicles and home energy storage to communications infrastructure, use batteries to enable portable power or provide a fall back in the event that mains power fails. If demands for batteries continue to grow, engineers need an easier approach to designing battery-powered systems.
RF Measurement Challenges for Emerging 5G and Millimeter Wave Devices
In the never-ending quest for more bandwidth, the wireless industry is moving towards technologies that will drastically alter the relationship between the radio and its antennas. Existing over-the-air (OTA) test techniques were developed to address situations …