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Meeting: HOU Section Consultant Network
Meeting: HOU Section Consultant Network
The IEEE HCN General Meeting on Wednesday May 31st at the Clayton Library Center at 5300 Caroline St., Houston, TX 77004, starting at 5:30pm. There is a no fee parking lot next to the library. The meeting will be in the Carriage House across the parking lot from the main library building. Our speaker will be... Read more
Webinar: Power Components for Battery Applications
Webinar: Power Components for Battery Applications
Today, many systems from electric vehicles and home energy storage to communications infrastructure, use batteries to enable portable power or provide a fall back in the event that mains power fails. If demands for batteries continue to grow, engineers need an easier approach to designing battery-powered systems.
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Free Tech Insider Webinar: RF Measurement Challenges for Emerging 5G and Millimeter Wave Devices
Free Tech Insider Webinar: RF Measurement Challenges for Emerging 5G and Millimeter Wave Devices
RF Measurement Challenges for Emerging 5G and Millimeter Wave Devices In the never-ending quest for more bandwidth, the wireless industry is moving towards technologies that will drastically alter the relationship between the radio and its antennas. Existing over-the-air (OTA) test techniques were developed to address situations where interactions between the radio, antenna, and their embedded... Read more
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Engineering Council of Houston 2017 Awards Banquet
Engineering Council of Houston 2017 Awards Banquet
Co-sponsored by: Sue Pritchett You are cordially invited to join the Engineering, Science, & Technology Council of Houston for the 2017 Awards Celebration The Reception will provide time for networking among Engineering, Science & Technology Council of Houston (ECH) member societies regarding common interests and challenges. Area leaders in K-12 Outreach will discuss opportunities for ECH member... Read more
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Tech Insider Webinar: A Fully Automatic Test System for Characterizing Wide-I/O Micro-Bump Probe Cards
Tech Insider Webinar: A Fully Automatic Test System for Characterizing Wide-I/O Micro-Bump Probe Cards
Overview Title: Tech Insider Webinar: A Fully Automatic Test System for Characterizing Wide-I/O Micro-Bump Probe Cards Date: Thursday, July 06, 2017 Time: 12:00 PM Eastern Daylight Time Duration: 1 hour In the context of pre-, mid-, and post-bond testing of dies in a 2.5D- and 3D-stacked IC, a fully automatic test system for characterizing advanced... Read more