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IEEE Region 5 Young Professionals Tech Talk Series: Creating a More Reliable Grid through Distribution Automation: Reconfiguration, Volt-Var & Design

February 14 @ 11:00 am - 12:00 pm CST

Join us every second Friday at 11AM CTS for an exciting series of technical presentation specifically designed for IEEE Young Professionals. This series will provide valuable insights into cutting-edge technologies, industry trends, and practical solutions to challenges faced in many sectors such as electrical, energy, electronics, etc.. Network with your peers, learn from subject matter experts, and learn something new outside of your career path!
Creating a More Reliable Grid Through Distribution Automation: Reconfiguration, Volt-Var & Design:
This talk discusses the integration of Automated Circuit Support and Volt Var Optimization (VVO) in distribution utility systems to improve grid reliability, efficiency, and power quality. Circuit Support focuses on reducing the duration and frequency of outages by enabling automated switching operations among nearby circuits during fault events. This system utilizes equipment with real-time fault detection and automated responses like back feeding to restore power to affected zones. The benefits of automated circuit support include reduced outage times and reliability in the electric utility grid. VVO enhances system performance by optimizing the voltage and lower reactive power (VAR) levels to reduce energy loss throughout the circuit. The importance of maintaining a low VAR-to-real power ratio is highlighted, particularly in mitigating the impact of inductive loads from industrial and residential sources. Autumn will also outline the process of designing and constructing distribution systems, including structural analysis, wooden utility poles, and line reconfiguration. The combination of these projects leads to a more efficient and resilient electrical grid, capable of better serving customers while minimizing the impact of outages and improving power quality.
Speaker(s): Autumn Vargo,
Virtual: https://events.vtools.ieee.org/m/462134